Hardware design on the aspect of noise, noise floor as a function of DIE IP(Analog, Digital, Clk)
Hardware design techniques to attain the lowest possible noise floor for 5G Baseband device DAC/ADC Test hardware (Loadboard). It covers identification of board noise sources, ground management, design techniques. Board signal layer management approach to protect critical analog, mixed-signal device I/Os and associated Ips. Introduction of ultra low noise (jitter) support circuit, high isolation rating signal switches, low noise linear regulators to power support circuitry. Phase noise analysis of ATE power supplies, PIN-Electronic channels, RF Instruments and its impact to overall noise floor of the test environment. This study to show the improvement in device(DUT) SINAD, SNR, and Test Yield with significantly reduced noise floor.