Richard L. Austin

President & Chief Technology Officer
Gamma Scientific
San Diego, California

Richard L. Austin is the president & chief technology officer of Gamma Scientific. With more than 40 years of experience in the design and development of optical radiation measurement instrumentation, Austin is a subject matter expert in the measurement of luminous intensity, flux, and spectral gonio-apparent characterization of retroreflective materials and information display color, luminance, and spatial and temporal performance characterization. His instrument systems development expertise includes computer-controlled scanning grating and diode array/CCD spectroradiometers and telespectroradiometers. His working knowledge of light-source characterization and metrology ranges from lamp-based devices such as tungsten, to the latest in LED, VCSELs, microLED, and information-display devices. He is the inventor and co-inventor of seven patents, including two for near-eye display measurement apparatus and methods. His work has found use in a broad range of applications, including: head-up display and direct-view display characterization for the F-16, F-18 and C-17, F-117 and F-35 military aircraft and commercial displays, quality assurance and process control for antireflection and other thin-film coatings, LED, flash lamp, and lamp-based systems. He served the ASTM E12 Color and Appearance Committee as a subcommittee working group chair, drafting standards for measurement methods and performance standards for retroreflective highway safety materials, and is also a member of several CIE Division 2 Technical committees. He is currently serving as a subject matter expert on several IEC TC110 technical committees responsible for the creation of display color, luminance, and resolution measurement standards.

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Presentation(s):

• Display Metrology Course: AR/VR Geometry/Terminology/LMD

  Sunday, May 8, 2022
  2:50 PM – 4:20 PM

• Display Metrology Course: AR/VR Measurement Methods

  Sunday, May 8, 2022
  4:20 PM – 5:20 PM